二次離子質譜儀(TOF-SIMS) · 表面成份分析收費：500元/件 · 縱深分佈分析收費：1,000元/件(小時) · 平面影像分析收費：500元/件. ... <看更多>
「tof sims」的推薦目錄：
tof sims 在 飛行時間二次離子質譜儀的原理與應用 的相關結果
Time-of-flight secondary ion mass spectrometer (TOF-SIMS) is capable of simultaneously analyzing trace organic molecules and inorganic elements in mass ranging ... ... <看更多>
tof sims 在 TOF-SIMS(飛行式二次離子質譜) - 歐陸檢驗 的相關結果
TOF -SIMS（飛行式二次離子質譜）是將一次離子脈衝束聚焦在樣品表面上，在濺射過程中產生二次離子的表面分析技術。分析這些二次離子可以得到有關表面上 ... ... <看更多>
tof sims 在 二次離子質譜儀(SIMS) - MA-tek 閎康科技 的相關結果
SIMS 另一主要應用為表面成份污染分析，如球型陣列封裝基板中金屬墊之污染監控，然而受限於入射離子束 ... Time-of-Flight SIMS [ TOF-SIMS M6 plus, IONTOF GmbH ]. ... <看更多>
tof sims 在 Time-of-Flight Secondary Ion Mass ... - SERC - Carleton 的相關結果
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed ion beam (Cs or ... ... <看更多>
tof sims 在 一文認識TOF-SIMS - 每日頭條 的相關結果
飛行時間-二次離子質譜儀（TOF-SIMS），是一種非常靈敏的表面分析技術。它利用一次離子激發樣品表面微量的二次離子，根據二次離子飛行到探測器的時間 ... ... <看更多>
tof sims 在 What is TOF-SIMS? - Ulvac-Phi 的相關結果
In TOF-SIMS, a Liquid Metal Ion Gun (LMIG), which has a submicron-level probe diameter and can achieve pulses of a few hundred picoseconds, is widely used as ... ... <看更多>
tof sims 在 TOF-SIMS（飛行時間二次離子質譜儀）_百度百科 的相關結果
TOF -SIMS（Time of Flight Secondary Ion Mass Spectrometry）是通過用一次離子激發樣品表面，打出極其微量的二次離子，根據二次離子因不同的質量而飛行到探測器的時間 ... ... <看更多>
tof sims 在 TOF-SIMS Surface Analysis Technique - Physical Electronics 的相關結果
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) provides elemental, chemical state, and molecular information from surfaces of solid materials. ... <看更多>
tof sims 在 依分析方式 的相關結果
(Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS). 儀器廠牌型號. IONTOF, TOF.SIMS 4,Germany. 購入日期. 2003年. 儀器原理. ... <看更多>
tof sims 在 乾貨| 二次離子質譜大科普！TOF-SIMS及D-SIMS例項分析 的相關結果
飛行時間二次離子質譜儀(TOF-SIMS)。在此類質譜儀中，二次離子被提取到無場漂移管，二次離子沿既定飛行路徑到達離子檢測器。由於給定離子的速度與其 ... ... <看更多>
tof sims 在 TOF SIMS | Thermo Fisher Scientific - TW 的相關結果
TOF SIMS (secondary ion mass spectrometry) is enabled by focused ion beam FIB milling, providing high resolution elemental characterization. ... <看更多>
tof sims 在 Bi Cluster TOF-SIMS Imaging of Inorganic and Organic Materials 的相關結果
TOF -SIMS is a relatively new analytical method, and undeveloped scientific fields still exist from viewpoints of not only instrumental developments but also ... ... <看更多>
tof sims 在 Time-of-Flight Secondary Ion Mass Spectrometry - Science ... 的相關結果
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a SIMS technique that focuses a pulsed beam of primary ions onto a sample surface, producing ... ... <看更多>
tof sims 在 Liquid ToF-SIMS revealing the oil, water, and surfactant ... 的相關結果
... and in situ time-of-flight secondary ion mass spectrometry (ToF-SIMS) to study the evolving O/W interface using a NAVY bilge model for the first time. ... <看更多>
tof sims 在 The Practice of Tof-sims: Time of Flight Secondary Ion Mass ... 的相關結果
書名：The Practice of Tof-sims: Time of Flight Secondary Ion Mass Spectrometry，語言：英文，ISBN：9781606507735，頁數：181，作者：Spool, Alan M.， ... ... <看更多>
tof sims 在 Time-of-Flight SIMS – ION-TOF SIMS 5 的相關結果
The ION TOF TOF-SIMS5 Time-of-Flight Secondary Ion Mass Spectrometer (TOF-SIMS) is a highly sensitive surface analytical technique, using a pulsed and ... ... <看更多>
tof sims 在 政府研究資訊系統GRB 的相關結果
、LDH、Flow 與Confocal 分析)，建立一套標準分析方法；並以飛行式二次離子質譜儀(Time of Flight‐Secondary Ion Mass Spectrometer; TOF‐SIMS) 提供質譜影像數據， ... ... <看更多>
tof sims 在 TOF-SIMS | Image Science 的相關結果
Time-of-Flight Secondary Ion Mass Spectrometry (ToF SIMS) is a highly sensitive analytical technique that provides chemical characterisation of the surfaces ... ... <看更多>
tof sims 在 TOF-SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) 的相關結果
TOF -SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) · Secondary electron microscopy (SEM): lateral resolution <40 nm. · Determines the chemical composition ... ... <看更多>
tof sims 在 TOF.SIMS 5 - IONTOF - TOF-SIMS (time of flight secondary ion ... 的相關結果
The TOF.SIMS 5 is equipped with a gridless reflectron type Time-of-Flight analyser. The non-linear reflectron design provides high transmission and high mass ... ... <看更多>
tof sims 在 Time-of-Flight Secondary Ion Mass Spectrometry | NIST 的相關結果
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the ... ... <看更多>
tof sims 在 Tof SIMS, Time-of-Flight Secondary Ion Mass Spectrometry 的相關結果
Tof -SIMS is also a useful tool to characterise composite materials, thin films, layer structures, corrosion mechanisms and catalysts contamination. Alternatives ... ... <看更多>
tof sims 在 TOF-SIMS基本原理、技术特点、应用案例，当堂答疑一分不花！ 的相關結果
飞行时间二次离子质谱仪（简称TOF-SIMS），使用一次脉冲离子入射固体材料表面，通过表面激发出的二次离子的飞行时间测量其质量, 以表征材料表面的元素 ... ... <看更多>
tof sims 在 ToF-SIMS - TESCAN ANALYTICS 的相關結果
Time-of-Flight Secondary Ion Mass Spectometry or ToF-SIMS is an elementary and molecular analysis method with very high sensibility on extrem surface (‹ 0.5 ... ... <看更多>
tof sims 在 Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 的相關結果
Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a highly sensitive analytical technique that describes the chemical composition and ... ... <看更多>
tof sims 在 Time-of-Flight SIMS 的相關結果
Secondary ion mass spectrometry (SIMS) is a high-vacuum surface analysis technique. With ppm to ppb level detection limits, it is amongst the most sensitive ... ... <看更多>
tof sims 在 A novel ToF-SIMS operation mode for sub 100 nm lateral ... 的相關結果
Keywords: ToF-SIMS, Oxygen isotope analysis, Lateral resolution ... Time of flight-secondary ion mass spectrometry (ToF-SIMS) has become a very popular ... ... <看更多>
tof sims 在 Kore SurfaceSeer I TOF-SIMS 的相關結果
SurfaceSeer-I是一个高灵敏度的TOF-SIMS，用于绝缘和导电表面的成像和化学绘图。SurfaceSeer-I是研究表面化学性质的理想之选，同样适用于研发以及工业质量控制应用。 ... <看更多>
tof sims 在 TOF-SIMS（二次离子飞行时间质谱仪） - 科学指南针 的相關結果
科学指南针可为您提供TOF-SIMS服务，TOF-SIMS是通过用一次离子激发样品表面，打出极其微量的二次离子，根据二次离子因不同的质量而飞行到探测器的时间不同来测定离子 ... ... <看更多>
tof sims 在 Analyzing 3D hyperspectral TOF-SIMS depth profile data ... 的相關結果
Here, we use SOM-RPM to characterize and interpret 3D TOF-SIMS depth ... methods such as time-of-flight secondary ion mass spectrometry (TOF-SIMS) are very ... ... <看更多>
tof sims 在 KNMFi - Technologies - ToF-SIMS - KIT 的相關結果
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is available only in less than 1.000 industrial and academic laboratories worldwide. ... <看更多>
tof sims 在 ToF-SIMS - Keck-II - NUANCE: Northwestern 的相關結果
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) ... <看更多>
tof sims 在 Time-of-Flight SIMS (ToF-SIMS) - Surface Science Western 的相關結果
ToF -SIMS (Time-of-Flight Secondary Ion Mass Spectrometry) is a surface analytical technique that uses an ion beam (primary ions) to remove small numbers of ... ... <看更多>
tof sims 在 Time-of-flight secondary ion mass spectrometry (TOF-SIMS ... 的相關結果
Download scientific diagram | Time-of-flight secondary ion mass spectrometry (TOF-SIMS) analysis of cycled Mo 6 S 8 electrode after being cycled for 40 ... ... <看更多>
tof sims 在 Time of flight secondary ion mass spectrometry (TOF-SIMS) for ... 的相關結果
TOF -SIMS helps clients to understand surface chemistry in organic and inorganic films. The surface chemistry is of high interest due to factors such as ... ... <看更多>
tof sims 在 ToF-SIMS 3D imaging unveils important insights on the ... 的相關結果
Time of Flight - Secondary Ion Mass Spectrometry (ToF-SIMS) is a versatile and noninvasive technique that allows for both label free imaging and ... ... <看更多>
tof sims 在 ToF SIMS for analysis of chemical composition - SuSoS AG 的相關結果
Time of Flight Secondary Ion Mass Spectrometry (ToF SIMS) is an established, multifaceted and reliable method for a clear and highly sensitive ... ... <看更多>
tof sims 在 Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 的相關結果
ToF -SIMS involves the use of a primary ion beam which is pulsed to produce packets of primary ions. Each primary ion packet impacts the sample surface and ... ... <看更多>
tof sims 在 TOF-SIMS | Time of Flight Secondary Ion Mass Spectroscopy 的相關結果
Time of Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface characterization technique which is based upon the liberation and identification of ... ... <看更多>
tof sims 在 Laboratory for ToF-SIMS analysis - Tascon 的相關結果
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface analysis method for the chemical characterization of solid surfaces in the laboratory ... ... <看更多>
tof sims 在 TOF-SIMS Analysis of Decoherence Sources in Nb ... - arXiv 的相關結果
In this study, we utilize time-of-flight secondary ion mass spectrometry (TOF-SIMS) to understand the role specific fabrication procedures ... ... <看更多>
tof sims 在 Publications TOF-SIMS - Empa 的相關結果
"Detection of Au+ Ions During Fluorine Gas-Assisted Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) for the Complete Elemental Characterization of ... ... <看更多>
tof sims 在 ToF-SIMS - SAIF, IIT Bombay 的相關結果
TOF -SIMS can obtain information regarding elements or molecular species within 1 nm of the sample surface at a very high detection sensitivity. Instrument ... ... <看更多>
tof sims 在 GCIB-TOF-SIMS 的相關結果
GCIB-TOF-SIMS. 表面汙染薄膜中的添加劑分析. 有機薄膜中的組成分布解析. 有機層的組成構造解析. 有機材料的低損害測定. 將最表面的汙染層以Ar-GCIB 去除後, ... ... <看更多>
tof sims 在 静态二次离子质谱（TOF-SIMS） - 测试狗·科研服务 的相關結果
Q2、请问测试TOF-SIMS时，正负离子都需要测，那么需要几个样品呢？是在同一个样品上选取不同的区域吗？ 如果是质谱和二维成像，是一个位置，因为没有损伤，采集完正的 ... ... <看更多>
tof sims 在 TOF-SIMS(飛行時間二次離子質譜儀) - 華人百科 的相關結果
TOF -SIMS(Time of Flight Secondary Ion Mass Spectrometry)是通過用一次離子激發樣品表面，打出極其微量的二次離子，根據二次離子因不同的質量而飛行到探測器的時間 ... ... <看更多>
tof sims 在 Tof - SIMS | UCLouvain 的相關結果
Principles Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a surface-sensitive analytical method that uses a pulsed beam of primary ion beams ... ... <看更多>
tof sims 在 Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 的相關結果
ToF -SIMS spectra are generated using a pulsed ion gun which shoots a focused beam of primary ions onto the sample surface. This causes a cascade of collisions ... ... <看更多>
tof sims 在 TOF-SIMS – RAMP - CSIRO Research 的相關結果
Search Search. TOF-SIMS. #TOF-SIMS. large complex instrument in lab. Don't put it in the bin! Scientists in a collaboration between RAMP, DATA 61 and La ... ... <看更多>
tof sims 在 TOF-SIMS analysis of exhaled particles from patients with ... 的相關結果
In the present study, we compared PEx from patients with asthma and controls using time-of-flight–secondary ion mass spectrometry (TOF-SIMS) and multivariate ... ... <看更多>
tof sims 在 ToF-SIMS analysis of antimony carboxylate EUV photoresists 的相關結果
Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is used to evaluate the composition of nonvolatile photoproducts created by EUV ... ... <看更多>
tof sims 在 TOF-SIMS原理和常见问题解答_离子 - 手机搜狐网 的相關結果
一、TOF-SIMS 飞行时间二次离子质谱仪介绍. TOF -SIMS（Time of Flight Secondary Ion Mass Spectrometry）是通过用一次离子激发样品表面，打出极其微量的 ... ... <看更多>
tof sims 在 ToF-SIMS - Equipment and Facilities 的相關結果
ToF -SIMS is an advanced label-free technique for the atomic and molecular characterisation and imaging of a broad range of materials in 2D and 3D. ... <看更多>
tof sims 在 TOF-SIMS | Surface Analysis Facility - WordPress at UD | 的相關結果
The Facility houses the technique of time-of-flight secondary-ion mass spectrometry, with the ION-TOF TOF-SIMS IV system (upgraded with a bismuth source... ... <看更多>
tof sims 在 利用ToF-SIMS和Rf-GDOES深度剖析技术研究柔性衬底上的隔 ... 的相關結果
目的：探究隔热多层膜VG1的层结构和光学性能。方法：利用飞行时间二次离子质谱(Time of Flight Secondary Ion Mass Spectroscopy, ToF-SIMS)和射频辉光放电发射光谱( ... ... <看更多>
tof sims 在 Time of Flight Secondary Ion Mass Spectrometry : TOF-SIMS 的相關結果
Furthermore, TOF-SIMS combined with etching ion beam such as gas cluster ion beam expands the ability to depth profiling and also 3D imaging. Time-of-flight ... ... <看更多>
tof sims 在 TOF SIMS V - MCPF - Service 的相關結果
Time-of-flight Secondary Ion Mass Spectrometer, ToF SIMS V (ION-TOF GmbH); Equipped with Bi cluster (Bi+, Bi3+, Bi3++ etc), C60 and Cs primary ion sources. ... <看更多>
tof sims 在 ToF-SIMS and Machine Learning for Single-Pixel Molecular ... 的相關結果
(24) investigated the surface chemistry of 70 different poly(meth)acrylate spots in a printed microarray, using ToF-SIMS imaging and ... ... <看更多>
tof sims 在 Time-of-Flight Secondary ION Mass Spectrometry (ToF SIMS) 的相關結果
Here, we are using a flight time analyzer, which can measure a complete mass spectrum per sputter pulse. In contrast to dynamic SIMS, ToF SIMS is a static SIMS ... ... <看更多>
tof sims 在 Biological tissue sample preparation for time-of-flight ... 的相關結果
Time-of-flight secondary ion mass spectrometry (ToF–SIMS) imaging is an analytical technique rapidly expanding in use in biological studies. ... <看更多>
tof sims 在 Time-of-Flight Secondary Ion Mass Spectrometry Laboratory ... 的相關結果
The IONTOF ToF-SIMS NCS instrument combines a Time-of-flight Secondary Ion Mass Spectrometer (ToF-SIMS) with an Atomic Force Microscope (AFM). ... <看更多>
tof sims 在 Development of Multiplexed ToF-SIMS Instrumentation 的相關結果
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful and widely used method for surface chemical analysis. ... <看更多>
tof sims 在 MST｜［TOF-SIMS］飛行時間型二次イオン質量分析法 的相關結果
最表面を高感度で分析可能; HからUまでの全元素、C,H,N,O,P,Sなどからなる有機物の分子イオンが取得可能; イメージ分析が可能; 有機・無機化合物の構造解析・同定が ... ... <看更多>
tof sims 在 Combining plasma profiling TOFMS with TOF-SIMS depth ... 的相關結果
Read our recent article showing the comparison of TOF-SIMS and Plasma Profiling TOFMS (PP-TOFMS) depth profiles of SiGe, metal silicides, ... ... <看更多>
tof sims 在 Understanding Chemical Inhomogeneities and Cation ... 的相關結果
Time-of-flight secondary-ion mass spectrometry (TOF-SIMS) is one of the few techniques that can obtain chemical information from all components of hybrid ... ... <看更多>
tof sims 在 TOF-SIMS谱峰检测方法及控制软件研究- 博士 的相關結果
【摘要】 飞行时间二次离子质谱(TOF-SIMS)是一种有效的表面分析技术,具有样品消耗量少、可微区原位分析、检测速度快和质量范围无限制等诸多优势。 ... <看更多>
tof sims 在 TOF-SIMS: Materials Analysis BY Mass Spectrometry 2nd Editon 的相關結果
ToF -SIMS: Surface Analysis by Mass Spectrometry 2nd EditionEdited by John C. Vickerman and David Briggs The Second Edition of this well-received book is ... ... <看更多>
tof sims 在 tof-sims分析——看完你就懂了！ - 日間新聞 的相關結果
飛行時間-二次離子質譜儀（TOF-SIMS），是一種非常靈敏的表面分析技術。它利用一次離子激發樣品表面微量的二次離子，根據二次離子飛行到探測器的時間不同 ... ... <看更多>
tof sims 在 Time of Flight Secondary Ion Mass Spectrometer (TOF.SIMS 5) 的相關結果
Equipment Type: Microscopy/Surface Analysis. Information the Equipment Can Provide. Ultra-high-resolution mass spectrometry (up to 0.001 a.m.u.). ... <看更多>
tof sims 在 ToF-SIMS Analysis of Dexamethasone Distribution in the ... 的相關結果
Time of flight secondary ion mass spectrometry (ToF-SIMS) is an extremely surface sensitive analytical technique that can characterize the chemical composition ... ... <看更多>
tof sims 在 ION TOF.SIMS Model 5-100 - University at Buffalo 的相關結果
TOF -SIMS 5, Ultra high vacuum time-of-flight mass spectrometer for chemical imaging, ion intensity mapping, depth profiling, and static mass spectra. This ... ... <看更多>
tof sims 在 Time-of-Flight Secondary Ion Mass Spectrometer 的相關結果
Time-of-Flight Secondary Ion Mass Spectroscopy (ToF SIMS) uses a pulsed ion beam (Cs or microfocused Ga) to remove molecules from the very outermost surface ... ... <看更多>
tof sims 在 Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) 的相關結果
Key words. surface analysis ToF-SIMS surface imaging polymers. To whom correspondence should be addressed. ... <看更多>
tof sims 在 Applications of XPS, AES, and TOF-SIMS 的相關結果
Dynamic Secondary Ion Mass Spectrometry (D-SIMS). ➢ Time-of-Flight Secondary SIMS (TOF-SIMS). • Fourier Transform Infrared Spectroscopy(FTIR). ... <看更多>
tof sims 在 TOF-SIMS | GCM Lab 的相關結果
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS). TOF-SIMS is one of the most powerful techniques to analyse solids since it gives the possibility ... ... <看更多>
tof sims 在 Flight Secondary Ion Mass Spectrometry (ToF-SIMS) Raw ... 的相關結果
•Introduction to ToF-SIMS. •Analytical challenge/need. Enormous quantity of data in raw data files. •Solution. Multivariate Statistical Analysis (MVSA) ... ... <看更多>
tof sims 在 ToF-SIMS 3d analysis of thin films deposited in high aspect ... 的相關結果
For the analysis of thin films, with high aspect ratio (HAR) structures, time-of-flight secondary ion mass spectrometry (ToF-SIMS) overcomes several ... ... <看更多>
tof sims 在 一文認識TOF-SIMS - 今天頭條 的相關結果
TOF -SIMS的原理及特點. 飛行時間-二次離子質譜儀（TOF-SIMS），是一種非常靈敏的表面分析技術。它利用一次離子激發樣品表面微量的二次離子，根據二次 ... ... <看更多>
tof sims 在 High‐resolution peak analysis in TOF SIMS data - Gelb - Wiley ... 的相關結果
High mass resolution time-of-flight secondary ion mass spectrometry (TOF SIMS) can provide a wealth of chemical information about a sample, ... ... <看更多>
tof sims 在 ToF-SIMS | NESAC/BIO 的相關結果
It is these secondary ions that are mass analyzed in SIMS. In static mode of ToF SIMS, the primary ion beam is maintained at a very low fluence (typically ... ... <看更多>
tof sims 在 TOF-SIMS | 概念理论| 技术资料 的相關結果
二次离子质谱（SIMS）的概念非常简单，一批拥有相同动能的离子按质量对电荷比的顺序飞行经过一条无电磁场的真空管到达离子检测器。该检测器输出电流，以时间为函数， ... ... <看更多>
tof sims 在 ToF-SIMS – Cutting Edge Chemical Analysis for Your FIB 的相關結果
Time of Flight Secondary Ion Mass Spectrometry or ToF-SIMS is an extremely sensitive and versatile chemical analysis technique with nanometer resolution. ... <看更多>
tof sims 在 ToF-SIMS and AFM Characterization of Brown Cosmetic ... 的相關結果
ToF -SIMS and AFM Characterization of Brown Cosmetic Contact Lenses: From Structural Analysis to the Identification of Pigments. Seon Hee Kim , 1 ... ... <看更多>
tof sims 在 Services_mc_TOFSIMS - Wintech Nano-Technology Services 的相關結果
TOF SIMS. Time-of-flight Secondary Ion Mass Spectrometry is a versatile instrument capable of parts-per-million sensitivity or better with parallel ... ... <看更多>
tof sims 在 IONTOF ToF-SIMS – GT - IEN/IMAT Materials Characterization ... 的相關結果
SIMS. The IONTOF 5-300 Time-of-Flight SIMS system uses a beam of ions to remove ... here or on the image at left to go to the ToF-SIMS tool page on SUMS. ... <看更多>
tof sims 在 What is Time-of-Flight Secondary Ion Mass Spectrometry (TOF ... 的相關結果
Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) is a surface analysis tool that concentrates a pulsed stream of primary ions onto a sample surface ... ... <看更多>
tof sims 在 飞行时间二次离子质谱仪（TOF-SIMS） - 仪器详情 的相關結果
TOF -SIMS是一种调查技术手段，可探测元素周期表中的所有元素，可分辨同位素。此外，TOF-SIMS也可以提供质谱讯息；在样品XY维度上的图像信息；以及样品Z ... ... <看更多>
tof sims 在 二次離子質譜分析儀(SIMS) - iST宜特 的相關結果
二次離子質譜分析儀(Secondary Ion Mass Spectrometer, SIMS)主要是利用 ... iST的SIMS高解析度，除了針對離子植入、摻雜量的P/N濃度定量分析外，還可 ... ... <看更多>
tof sims 在 An Introduction to Time-of-Flight Secondary Ion Mass ... 的相關結果
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization ... ... <看更多>
tof sims 在 ToF-qSIMS Workstation - Hiden Analytical 的相關結果
The Hiden ToF-qSIMS is a time of flight analyser for quadrupole mass spectrometry. The system enhances SIMS for the highest possible performance. ... <看更多>
tof sims 在 一文认识TOF-SIMS - 知乎专栏 的相關結果
TOF -SIMS的原理及特点飞行时间-二次离子质谱仪（TOF-SIMS），是一种非常灵敏的表面分析技术。它利用一次离子激发样品表面微量的二次离子， ... ... <看更多>
tof sims 在 ToF-SIMS – Ascent - Ascent+ 的相關結果
ToF -SIMS. Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) uses a focused, energetic primary ion beam to analyse the sample ... ... <看更多>
tof sims 在 Combination of orthogonal TOF-SIMS with FIB-SEM by ... 的相關結果
Korean Jeju hosted acknowledged experts in TOF-SIMS at the end of ... The Time of Flight (TOF) Secondary Ion Mass Spectrometry (SIMS) uses ... ... <看更多>
tof sims 在 Applicability of ToF-SIMS for monitoring compositional ... 的相關結果
ToF -SIMS was originally developed as a technique for the analysis of inorganic solids and in particular for the evaluation of concentration ... ... <看更多>
tof sims 在 飛行時間二次離子質譜（TOF-SIMS） 的相關結果
飛行時間二次離子質譜（TOF-SIMS）是一種表面分析技術，可將脈衝的初級離子束聚焦到樣品表面，在濺射過程中產生二次離子. 分析這些次級離子可提供有關表面上存在的分子、 ... ... <看更多>